In situ characterization of rare earth-CdTe heterostructures by ion beam analysis
- 1 September 1994
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 249 (2) , 266-270
- https://doi.org/10.1016/0040-6090(94)90773-0
Abstract
No abstract availableKeywords
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