A physically-based transient SPICE model for GaAs MESFET's

This publication has 5 references indexed in Scilit:

• Modeling and suppression of the surface trap effect on drain current frequency dispersions in GaAs MESFETs
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Conductance DLTS analysis of the correlation between power slump and gate lag
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Empirical modeling of low-frequency dispersive effects due to traps and thermal phenomena in III-V FET's
  IEEE Transactions on Microwave Theory and Techniques, 1995
• Frequency-dependent electrical characteristics of GaAs MESFETs
  IEEE Transactions on Electron Devices, 1990
• Status of the surface and bulk parasitic effects limiting the performances of GaAs IC's
  Physica B+C, 1985