Power pin testing: making the test coverage complete
- 8 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Defect detection using power supply transient signal analysisPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Testing multiple power connections with boundary scanPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Opens board test coverage: when is 99% really 40%?Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002