Measurement of proton-induced radiation damage effects in double-sided silicon microstrip detectors
- 1 November 1997
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 399 (1) , 76-84
- https://doi.org/10.1016/s0168-9002(97)00913-3
Abstract
No abstract availableKeywords
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