Computer Program for Determining Optical Constants of a Film on an Opaque Substrate

1 November 1969

journal article
Published by Optica Publishing Group in Applied Optics

Vol. 8 (11) , 2366-2368
https://doi.org/10.1364/ao.8.002366

Abstract

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This publication has 4 references indexed in Scilit:

Formation and Growth of Tarnish on Evaporated Silver Films
Journal of Applied Physics, 1969
Validity of Ellipsometry for Determining the Average Thickness of Thin, Discontinuous, Absorbing Films*
Journal of the Optical Society of America, 1969
Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film Thickness
Applied Optics, 1966
Multiple-Beam Fringes of Equal Chromatic Order Part IV Use of Multilayer Films
Journal of the Optical Society of America, 1955