Measurement of white and 1/f noise within burst noise
- 1 January 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 62 (12) , 1711-1713
- https://doi.org/10.1109/proc.1974.9691
Abstract
A measurement method is described which enables the separate measurement of the power spectra of the normal noise (white and l/f) superimposed on burst noise. With this method the power spectra of normal noise can be determined for each burst noise level. It is found that the clean burst noise and the superimposed normal noise are generated by statistically independent processes. The fact that burst noise devices have a higher 1/f noise power content than devices without burst noise indicates that there exists a common condition for the generation of burst noise and 1/f noise.Keywords
This publication has 2 references indexed in Scilit:
- Narrow-band variance noiseJournal of Applied Physics, 1974
- Physical model for burst noise in semiconductor devicesSolid-State Electronics, 1970