Study of the effects of neutron irradiation on silicon strip detectors
- 1 May 1992
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 315 (1-3) , 156-160
- https://doi.org/10.1016/0168-9002(92)90697-3
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Tests of the radiation hardness of VLSI integrated circuits and silicon strip detectors for the SSC under neutron, proton, and gamma irradiationIEEE Transactions on Nuclear Science, 1991
- Measurement of proton induced radiation damage to CMOS transistors and p-i-n diodesIEEE Transactions on Nuclear Science, 1990
- Generation-recombination phenomena in almost ideal silicon p-n junctionsJournal of Applied Physics, 1988
- Radiation damage test of silicon multistrip detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988