Cyclotron and subband emission from Si-inversion layers
- 1 May 1978
- journal article
- Published by Elsevier in Surface Science
- Vol. 73, 217-221
- https://doi.org/10.1016/0039-6028(78)90492-2
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- Far-Infrared Cyclotron Resonance in the Inversion Layer of SiliconPhysical Review Letters, 1974
- Cyclotron Resonance of Electrons in an Inversion Layer on SiPhysical Review Letters, 1974
- Magnetospectroscopy of shallow donors in GaAsSolid State Communications, 1969
- Far Infrared Reflection Spectra of AgCl, AgBr, and AgI at Low TemperaturesApplied Optics, 1968
- A high-detectivity gallium-doped germanium detector for the 40–120μ regionInfrared Physics, 1965