Ellipsometric analyses for an absorbing surface film on an absorbing substrate with or without an intermediate surface layer
- 30 June 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 56, 97-108
- https://doi.org/10.1016/0039-6028(76)90437-4
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Characterization of real surfaces by ellipsometrySurface Science, 1972
- Generalized Ellipsometric Method for the Absorbing Substrate Covered with a Transparent-Film System Optical Constants of Silicon at 3655 Å*Journal of the Optical Society of America, 1972
- Definitions and conventions in ellipsometrySurface Science, 1969