Identification of undetectable faults in combinational circuits
- 7 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Identification of undetectable faults is essential for preventing test invalidation due to the occurrence of such faults, and for improving the efficiency of test generation. Methods for identifying undetectable faults in combinational circuits by analyzing regions between fanout stems and reconvergent gates are presented. These methods have been successful in identifying many of the undetectable faults in several benchmark circuits, without test generation.Keywords
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