The effect of operating conditions on margin decay for half disk bubble propagation elements
- 1 September 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 13 (5) , 1592-1594
- https://doi.org/10.1109/tmag.1977.1059625
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Magnetic bubble device processing and pickax circuit designIEEE Transactions on Magnetics, 1976
- 68 kbit capacity 16 µm-period magnetic bubble memory chip design with 2 µm minimum featuresIEEE Transactions on Magnetics, 1976
- Long-term testing of 68 kbit bubble device chipsIEEE Transactions on Magnetics, 1976
- Data unreliability in bubble memory devices caused by spontaneous annihilationAIP Conference Proceedings, 1976
- Spontaneous annihilations in magnetic bubble propagationJournal of Applied Physics, 1975