Structural analysis of an Si/CoSi2/Si heterostructure using ultrahigh resolution transmission electron microscopy
- 1 March 1986
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 137 (2) , 351-361
- https://doi.org/10.1016/0040-6090(86)90036-2
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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