Characterization of multiple-bit errors from single-ion tracks in integrated circuits
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 2267-2274
- https://doi.org/10.1109/23.45434
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Lateral charge transport from heavy-ion tracks in integrated circuit chipsIEEE Transactions on Nuclear Science, 1988
- Charge Funneling in N- and P-Type Si SubstratesIEEE Transactions on Nuclear Science, 1982