Lateral charge transport from heavy-ion tracks in integrated circuit chips
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 35 (6) , 1644-1647
- https://doi.org/10.1109/23.25513
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Correlation of Particle-Induced Displacement Damage in SiliconIEEE Transactions on Nuclear Science, 1987
- Models for Total Dose Degradation of Linear Integrated CircuitsIEEE Transactions on Nuclear Science, 1987
- Introduction to Radiological Physics and Radiation DosimetryPublished by Wiley ,1986
- The Effects of Radiation on Electronic SystemsPublished by Springer Nature ,1986
- Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAMIEEE Transactions on Nuclear Science, 1985
- A Comparison of Radiation Damage in Linear ICs from COBALT-60 Gamma Rays and 2.2 MeV ElectronsIEEE Transactions on Nuclear Science, 1983
- The Structure of Displacement Cascades in SiliconIEEE Transactions on Nuclear Science, 1982
- Neutron Fluence and Electric Field Strength Dependencies of the Rate of Volume Damage Introduction in Silicon P-N JunctionsIEEE Transactions on Nuclear Science, 1969
- A Study of the Neutron-Induced Base Current Component in Silicon TransistorsIEEE Transactions on Nuclear Science, 1965