CMOS/SOS memory circuits for radiation environments

This publication has 8 references indexed in Scilit:

• Radiation-Hardened Silicon-Gate CMOS/SOS
  IEEE Transactions on Nuclear Science, 1977
• Two static 4K clocked and nonclocked RAM designs
  IEEE Journal of Solid-State Circuits, 1977
• Process technology for radiation-hardened CMOS integrated circuits
  IEEE Journal of Solid-State Circuits, 1976
• A threshold voltage controlling circuit for short channel MOS integrated circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1976
• Substrate and load gate voltage compensation
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1976
• Prompt Radiation Damage and Short Term Annealing in CMOS/SOS Devices
  IEEE Transactions on Nuclear Science, 1976
• Investigation of Radiation Effects and Hardening Procedures for CMOS/SOS
  IEEE Transactions on Nuclear Science, 1975
• Peripheral circuits for one-transistor cell MOS RAM's
  IEEE Journal of Solid-State Circuits, 1975