Electron energy loss spectroscopy—An additional tool to characterize thin films of cubic boron nitride
- 28 February 1998
- journal article
- Published by Elsevier in Diamond and Related Materials
- Vol. 7 (2-5) , 385-390
- https://doi.org/10.1016/s0925-9635(97)00225-2
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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