A vacuum ultraviolet scanning reflectometer designed to minimize alignment errors
- 1 August 1970
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 3 (8) , 633-635
- https://doi.org/10.1088/0022-3735/3/8/311
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Ultrahigh Vacuum Reflectometer for Use with Extreme Ultraviolet Synchrotron RadiationReview of Scientific Instruments, 1969
- Angle-Doubler for Reflectance Measurements in Evacuated SystemsReview of Scientific Instruments, 1968
- On the Cause of Errors in Reflectance vs Angle of Incidence Measurements and the Design of Reflectometers to Eliminate the ErrorsApplied Optics, 1967
- Errors in using the Reflectance vs Angle of Incidence Method for Measuring Optical Constants*Journal of the Optical Society of America, 1965
- Apparatus for the Measurement of Vacuum Ultraviolet Optical Properties of Freshly Evaporated Films before Exposure to AirJournal of the Optical Society of America, 1961
- Reflectance-Increasing Coatings for the Vacuum Ultraviolet and Their Applications*Journal of the Optical Society of America, 1960
- On Calculating the Optical Constants from Reflection CoefficientsJournal of the Optical Society of America, 1939