Magnetotransport measurements and low-temperature scattering times of electron gases in high-quality Si/Si1xGex heterostructures

Abstract
We report Shubnikov–de Haas and Hall measurements conducted on n-type modulation-doped Si/Si1x Gex heterostructures grown on relaxed Si1x Gex buffer layers. Hall mobilities up to 174 700 cm2/V s at T=0.35 K are achieved. We observe the lifting of both the spin and the valley degeneracies at rather low magnetic fields and well-defined quantum Hall plateaus at integer filling factors. The single-particle relaxation times τs are of the order of 1 ps for all samples investigated. Assuming an effective transport mass of 0.19m0 for the electrons in the lowest, twofold-degenerate Si conduction band, the transport times τt exceed τs by more than an order of magnitude. This result clearly indicates that long-range impurity scattering is the dominant scattering mechanism in high-quality Si/Si1x Gex heterostructures.