Quad DCVS dynamic logic fault modeling and testing
- 27 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 356-362
- https://doi.org/10.1109/test.1998.743174
Abstract
Dynamic logic fails differently than static logic. Fault modeling with Quad Differential Cascode Voltage Switch (DCVS) is studied in simulation and hardware. Appropriate test methods are examined yielding results relevant to general dynamic logic, DCVS, and pass gate DCVS.Keywords
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