Research with x rays
- 1 May 1981
- journal article
- research article
- Published by AIP Publishing in Physics Today
- Vol. 34 (5) , 40-49
- https://doi.org/10.1063/1.2914567
Abstract
The brightness of x rays from synchrotron radiation sources has started a renaissance in a field thought to have been left barren by scientists of the first half of this century. By precisely tuning synchrotron radiation to specific electron energy levels researchers are gaining detailed knowledge of the spatial arrangement and electronic structure of atoms in solids. This knowledge promises not only to lead to advances in condensed‐matter theory but to aid in the development of materials with physical and chemical properties tailored to meet specific needs. Experimenters are using the x rays of synchrotron radiation to see biological material at great magnification even in the presence of water, to study the atomic structure of catalytic surfaces while the catalyst is in action, to observe the transient behavior of crystal growth or plastic deformation at millisecond intervals, and to determine atomic arrangements and bonding distances from less than a onolayer of material, just to mention a few examples. A byproduct of the unwieldy devices of medium‐ and high‐energy physics, synchrotron radiation is rapidly becoming one of the most useful contributors to the atomic and molecular sciences.Keywords
This publication has 17 references indexed in Scilit:
- X-Ray Standing Waves at Crystal SurfacesPhysical Review Letters, 1980
- Extended X-Ray-Absorption Fine Structure of Surface Atoms on Single-Crystal Substrates: Iodine Adsorbed on Ag(111)Physical Review Letters, 1978
- Structure determination of self-interstitials and investigation of vacancy clustering in copper by diffuse X-ray scatteringJournal of Nuclear Materials, 1978
- New application of extended x-ray absorption fine structure (EXAFS) as a surface probe-nature of oxygen interaction with a ruthenium catalystThe Journal of Chemical Physics, 1977
- Measurements of integrated intensity near the absorption edge with synchrotron radiationJournal of Applied Crystallography, 1977
- Synchrotron Radiation Studies of the -Edge Photoabsorption Spectra of Kr, , and Ge: A Comparison of Theory and ExperimentPhysical Review Letters, 1975
- A report on the application of synchrotron radiation to low-angle scatteringJournal of Applied Crystallography, 1974
- New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine StructurePhysical Review Letters, 1971
- Detection of Foreign Atom Sites by Their X-Ray Fluorescence ScatteringPhysical Review Letters, 1969
- The Structure of Thin Oxide Films Formed on Nickel CrystalsJournal of the Electrochemical Society, 1969