Investigation of compensation defects in CdTe:Cl samples grown by different techniques

This publication has 14 references indexed in Scilit:

• Analysis of photoinduced current transient spectroscopy (PICTS) data by a regularization method
  Journal of Physics: Condensed Matter, 1992
• Evidence for substitutional-interstitial defect motion leading to DX behavior by donors in ${\mathrm{Al}}_{\mathit{x}}$${\mathrm{Ga}}_{1\mathrm{-}\mathit{x}}$As
  Physical Review Letters, 1992
• A reliable and fast method for the solution of Fredhol integral equations of the first kind based on Tikhonov regularization
  Computer Physics Communications, 1992
• Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS) of Deep Centers in CdTe Single Crystals
  Japanese Journal of Applied Physics, 1988
• Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS)
  Japanese Journal of Applied Physics, 1987
• Photo-Induced Current Transient Spectroscopy in High-Resistivity Bulk Material. I. Computer Controlled Multi-Channel PICTS System with High-Resolution
  Japanese Journal of Applied Physics, 1983
• CONTIN: A general purpose constrained regularization program for inverting noisy linear algebraic and integral equations
  Computer Physics Communications, 1982
• A constrained regularization method for inverting data represented by linear algebraic or integral equations
  Computer Physics Communications, 1982
• Deep-level spectroscopy in high-resistivity materials
  Applied Physics Letters, 1978
• Deep-level transient spectroscopy: A new method to characterize traps in semiconductors
  Journal of Applied Physics, 1974