Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS) of Deep Centers in CdTe Single Crystals
- 1 December 1988
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 27 (12R) , 2256-2259
- https://doi.org/10.1143/jjap.27.2256
Abstract
Deep levels in p-type CdTe were studied by SADLTS (spectral analysis deep level transient spectroscopy). Three levels, labeled as A(0.57 eV), B(0.20 eV) and C(0.10 ev) were found. The B and C levels which have, so far, been considered as a single level, have been resolved into two closely spaced levels in our method. Moreover, these two levels were found to have emission rate spectra with finite widths rather than discrete ones. The analysis of the emission rate spectrum indicates that there is a finite distribution in the capture cross section of deep levels.Keywords
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