Multi-Exponential Analysis of DLTS by Contin
- 1 January 1986
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Multi-exponential analysis of DLTSApplied Physics A, 1986
- Fourier analysis for the isothermal capacitance transient spectroscopy signalApplied Physics Letters, 1985
- DX Deep Centers in AlxGa1-xAs Grown by Liquid-Phase EpitaxyJapanese Journal of Applied Physics, 1984
- The use of linear predictive modeling for the analysis of transients from experiments on semiconductor defectsJournal of Applied Physics, 1984
- Deep level transient spectroscopy evaluation of nonexponential transients in semiconductor alloysJournal of Applied Physics, 1983
- A novel method to detect nonexponential transients in deep level transient spectroscopyJournal of Applied Physics, 1982
- The analysis of exponential and nonexponential transients in deep-level transient spectroscopyJournal of Applied Physics, 1981
- Isothermal Capacitance Transient Spectroscopy for Determination of Deep Level ParametersJapanese Journal of Applied Physics, 1980
- A Fourier method for the analysis of exponential decay curvesBiophysical Journal, 1976
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974