Quantitative X-ray microanalysis of thin foils in STEM
- 1 April 1986
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 15 (2) , 121-129
- https://doi.org/10.1002/xrs.1300150210
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- X-ray microanalytical senstivity and spatial resolution in scanning transmission electron microscopesX-Ray Spectrometry, 1978
- Evaluation of a new correction procedure for quantitative electron probe microanalysisJournal of Physics D: Applied Physics, 1978
- The K-shell fluorescence yield and atomic shell structure effectsJournal of Physics B: Atomic and Molecular Physics, 1970
- Atomic Fluorescence YieldsReviews of Modern Physics, 1966
- The Effect of Atomic Number in X-Ray MicroanalysisPublished by Elsevier ,1963
- The Intensity of Emission of Characteristic X-RadiationProceedings of the Physical Society. Section A, 1956
- Le rendement de fluorescenceJournal de Physique et le Radium, 1955
- Zur Theorie des Durchgangs schneller Korpuskularstrahlen durch MaterieAnnalen der Physik, 1930
- Über strahlungslose QuantensprüngeThe European Physical Journal A, 1927