Formation and characterization of grain-oriented VO2 thin films
- 15 December 1989
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 66 (12) , 5844-5850
- https://doi.org/10.1063/1.343605
Abstract
Grain‐oriented films of VO2 have been prepared to characterize the effects of film orientation on electrical and optical switching performance. This oriented growth has been achieved by lattice matching to (0001) sapphire, and results in intergranular structures favorable to rapid propagation of the monoclinic‐tetragonal phase transformation. The electrical and optical property changes across this transition are strongly affected by film microstructure, with the oriented structures favoring rapid switching and narrow hysteresis.This publication has 22 references indexed in Scilit:
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