Investigation of the X-Ray Scattering Intensity for the Laue-Case Diffraction under Total-External-Reflection Conditions
- 16 May 1983
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 77 (1) , K91-K94
- https://doi.org/10.1002/pssa.2210770170
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- X-ray total-external-reflection–Bragg diffraction: A structural study of the GaAs-Al interfaceJournal of Applied Physics, 1979