"Current Striction"—A Mechanism of Electrostriction in Many-Valley Semiconductors
- 15 September 1967
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 161 (3) , 815-822
- https://doi.org/10.1103/PhysRev.161.815
Abstract
Previously reported experiments tentatively suggest that electric fields applied to germanium produce deformations which are about times as large as those expected from conventional electrostriction mechanisms. We have calculated the magnitude, temperature dependence, and angular dependence of this effect for -type many-valley semiconductors. Our model does not involve a polarization in real space but, like the current, is mediated by a shift of the electron distribution in reciprocal space. This field-induced shift increases the energy of the electrons within each valley, but the increase is largest in those valleys with smallest effective mass parallel to the field direction. It then becomes energetically favorable for the lattice to deform in such a way that the deformation potential lowers the energy of the high-curvature valleys at the expense of the low-curvature valleys. We calculate a much larger effect in germanium than in silicon, predicting also that the induced strain should be a pure shear in germanium, and a pure volume-preserving linear dilatation in silicon.
Keywords
This publication has 8 references indexed in Scilit:
- Electrostriction in germaniumSolid State Communications, 1965
- Cyclotron Resonance in Uniaxially Stressed Silicon. II. Nature of the Covalent BondPhysical Review B, 1965
- Cyclotron Resonance Experiments in Uniaxially Stressed Silicon: Valence Band Inverse Mass Parameters and Deformation PotentialsPhysical Review B, 1963
- Stress Optical Constants of GermaniumJournal of Applied Physics, 1961
- The Electronic Contribution to the Elastic Properties of GermaniumIBM Journal of Research and Development, 1961
- Acoustoelectric Effect in-Type GermaniumPhysical Review B, 1959
- Transport and Deformation-Potential Theory for Many-Valley Semiconductors with Anisotropic ScatteringPhysical Review B, 1956
- Transport Properties of a Many-Valley SemiconductorBell System Technical Journal, 1955