Surface electromigration of In and Cu on Si(111) surfaces studied by REM
- 1 February 1991
- journal article
- Published by Elsevier in Surface Science
- Vol. 242 (1-3) , 181-190
- https://doi.org/10.1016/0039-6028(91)90263-r
Abstract
No abstract availableFunding Information
- Ministry of Education, Culture, Sports, Science and Technology (01609501, 63609507)
This publication has 5 references indexed in Scilit:
- Hetero-electromigration on semiconductor surfacesSurface Science, 1991
- Surface electromigration of metal atoms on Si(111) surfaces studied by UHV reflection electron microscopyUltramicroscopy, 1989
- Electronic structure of the single-domain Si(001)21-K surfacePhysical Review B, 1989
- Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffractionSurface Science, 1985
- Field-induced surface transport of indium adatoms on Si(111) surfacesThin Solid Films, 1982