Piezoelectric Properties of Se Film Deposited on Te Crystal
- 1 June 1970
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 9 (6)
- https://doi.org/10.1143/jjap.9.631
Abstract
Se films deposited on Te crystals were studied as an ultrasonic transducer of a delay line and as a driver of a composite resonator. The values of electromechanical coupling factors k 11 and k 26 of Se were deduced as 0.15 and 0.27 respectively from the experimental and theoretical characteristics of the insertion loss of the delay line, and the value of the piezoelectric constant e 11 was obtained as 0.17C/m2 from these coupling factors.Keywords
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