Microstructure and Property Characterization of Sintered Si₃N₄, SiC, and SiAlON

Publisher Website

1 January 1982

journal article
Published by Wiley in Journal of the American Ceramic Society

Vol. 65 (1) , C‐2-C‐3
https://doi.org/10.1111/j.1151-2916.1982.tb09925.x

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

The Microstructure and Distribution of Impurities in Hot‐Pressed and Sintered Silicon Nitrides
Journal of the American Ceramic Society, 1979
Oxidation of Si₃N₄ in the Range 1300^° to 1500^°C
Journal of the American Ceramic Society, 1976