Influence of Bulk and Surface Properties on Image Sensing Silicon Diode Arrays
- 1 November 1968
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 47 (9) , 1827-1854
- https://doi.org/10.1002/j.1538-7305.1968.tb01092.x
Abstract
Silicon diode arrays for use as the electron-beam accessed target in camera tubes for the Picturephone visual telephone set have been fabricated and their properties evaluated. These targets offer significant advantages over the antimony tris...Keywords
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