The growth of organic thin films on silicon substrates studied by X-ray reflectometry
- 1 August 1992
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 215 (2) , 213-217
- https://doi.org/10.1016/0040-6090(92)90440-m
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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