Photoluminescence study of Cu diffusion and electromigration in CdTe
- 19 July 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (3) , 361-363
- https://doi.org/10.1063/1.124375
Abstract
We report changes in the photoluminescence (PL) spectra associated with the diffusion of Cu in CdTe thin films used in CdTe/CdS solar cells. We studied films grown by vapor transport deposition and radio-frequency sputtering as well as single-crystal CdTe. The main effects of Cu diffusion appear to be the quenching of a donor-acceptor transition associated with Cd vacancies and the increase in intensity of a lower energy band due to deep acceptor states. The changes in junction PL are consistent with the movement of Cu+ ions in the electric fields near the CdS/CdTe junction.Keywords
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