High spatial resolution in stem x-ray microanalysis
- 31 December 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 9 (3) , 311-318
- https://doi.org/10.1016/0304-3991(82)90218-2
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Some aspects of quantitative STEM X‐ray microanalysis*Journal of Microscopy, 1981
- Scanning transmission electron microscopy: microanalysis for the microelectronic ageJournal of Physics F: Metal Physics, 1981
- Performance of a field emission gun scanning electron microscope columnUltramicroscopy, 1980
- Adjustment of a STEM instrument by use of shadow imagesUltramicroscopy, 1979
- Contribution to the contamination problem in transmission electron microscopyUltramicroscopy, 1978