Analysis of Domain-Size Distributions in Epitaxial Growth Using Leed Angular Profiles

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Abstract
Angular profiles of diffracted beams in surface-sensitive diffraction techniques can be used to establish the degree of order at the surface of crystals. Results are presented showing the sensitivity of such profiles to the growth mode of overlayer islands. A method is presented to incorporate the two-dimensional nature of the problem into the analysis and to extract finite-size effects from fundamental and superlattice beams.