Electrical Properties of La-Sr-Cu-O/Al Contact
- 1 June 1987
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 26 (6A) , L1017
- https://doi.org/10.1143/jjap.26.l1017
Abstract
Current-voltage characteristics of La-Sr-Cu-O(LSCO)/Al contacts have been measured. The results imply that the dominant conduction mechanism is Schottky emission, and that an insulating layer exists between the LSCO and the aluminum. The thickness and the relative dielectric constant of the layer have been estimated to be 25 nm and 7.5 respectively from its capacitance and the slope of the current-voltage plot.Keywords
This publication has 1 reference indexed in Scilit:
- High quality refractory Josephson tunnel junctions utilizing thin aluminum layersApplied Physics Letters, 1983