BILOW-simulation of low-temperature bipolar device behavior
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 36 (8) , 1475-1488
- https://doi.org/10.1109/16.30961
Abstract
No abstract availableThis publication has 33 references indexed in Scilit:
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