Electrical characterization of single-walled carbon nanotubes with Scanning Force Microscopy
- 1 August 2001
- journal article
- Published by Elsevier in Materials Science and Engineering: C
- Vol. 15 (1-2) , 149-151
- https://doi.org/10.1016/s0928-4931(01)00264-8
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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