Hall and Drift Mobility in High-Resistivity Single-Crystal Silicon
- 15 January 1957
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 105 (2) , 522-523
- https://doi.org/10.1103/physrev.105.522
Abstract
Room-temperature Hall and drift mobilities have been measured for samples of single-crystal silicon ranging in resistivity from about ohm cm to nearly intrinsic. The Hall mobility figures indicated for lattice scattering are 1560 and 345 /volt sec for electrons and holes respectively, whereas drift mobility values of 1360 and 510 /volt sec for electrons and holes, respectively, are found.
Keywords
This publication has 8 references indexed in Scilit:
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