Unusual thickness dependence of the dielectric constant of erbium oxide films
- 1 April 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 33 (2) , 185-192
- https://doi.org/10.1016/0040-6090(76)90079-1
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- A.C. behaviour of vacuum-deposited praseodymium oxide filmsThin Solid Films, 1974
- Dielectric and optical properties of ZnS filmsThin Solid Films, 1973
- On the existence and structure of gadolinium and samarium monoxides and their related lower oxidesPhysica Status Solidi (a), 1972
- Dielectric Properties of Y2O3 Thin Films Prepared by Vacuum EvaporationJapanese Journal of Applied Physics, 1970
- Study of Erbium Thin Film Oxidation in the Electron MicroscopePhysica Status Solidi (b), 1967
- Lower Oxides of Samarium and Europium. The Preparation and Crystal Structure of SmO0.4-0.6, SmO and EuO1Journal of the American Chemical Society, 1956