Characterization of silica overlayers deposited on ZrO2 and TiO2 by CVD of Si(OC2H5)4
- 1 July 1988
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 11 (10) , 517-521
- https://doi.org/10.1002/sia.740111005
Abstract
No abstract availableKeywords
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