Formation process of MnBi thin films by Williams' method
- 16 March 1983
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 76 (1) , 75-83
- https://doi.org/10.1002/pssa.2210760107
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Relative measurements of stopping cross section factors by back-scatteringThin Solid Films, 1973
- Formation process of MnBi thin filmsIEEE Transactions on Magnetics, 1972
- Preparation and Stability of MnBi Thin FilmsJournal of Applied Physics, 1971
- Analysis of amorphous layers on silicon by backscattering and channeling effect measurementsSurface Science, 1970
- Magnetostriction and Magnetic Anisotropy of MnBiJournal of Applied Physics, 1957