High performance germanium photodetectors integrated on submicron silicon waveguides by low temperature wafer bonding

Abstract
We demonstrate germanium photodetectors integrated on submicron silicon waveguides fabricated with a low temperature (≤ 400°C) wafer bonding and ion-cut process. The devices shows a low dark current of ∼100 nA, a fiber accessed responsivity of > 0.4 A/W and an estimated quantum efficiency of above 90%.