Analytical Approximations for the Distributions of Intrinsic Point Defects in Grown Silicon Crystals
- 16 December 1999
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 176 (2) , 843-865
- https://doi.org/10.1002/(sici)1521-396x(199912)176:2<843::aid-pssa843>3.0.co;2-8
Abstract
No abstract availableKeywords
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