Measurement of SOI MOSFET I-V characteristics without self-heating

Publisher Website

17 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/soi.1994.514276

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

Measurement and modeling of self-heating in SOI nMOSFET's
IEEE Transactions on Electron Devices, 1994
Use of noise thermometry to study the effects of self-heating in submicrometer SOI MOSFETs
IEEE Electron Device Letters, 1992
Electrical transient study of negative resistance in SOI MOS transistors
Electronics Letters, 1990