Comments on circuit models for MOSFET thermal noise
- 1 January 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 28 (2) , 184-185
- https://doi.org/10.1109/4.192054
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Simulation-oriented noise model for MOS devicesIEEE Journal of Solid-State Circuits, 1987
- Problems in Precision Modeling of the MOS Transistor for Analog ApplicationsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
- Thermal Noise in Field-Effect TransistorsProceedings of the IRE, 1962