The recording of microdiffraction patterns in scanning transmission electron microscopy
- 1 November 1985
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 18 (11) , 949-953
- https://doi.org/10.1088/0022-3735/18/11/016
Abstract
A VG Scientific HB501 scanning transmission electron microscope has been fitted with a novel system for recording microdiffraction patterns from extremely small volumes of matter (less than 500 atoms) at near-unity detection quantum efficiency and high resolution (0.25 mrad). Electrons are incident upon a 35 mm photographic film which is separated from the ultra-high vacuum of the specimen chamber by a 7.4 mu m thick window of Kapton polyimide foil. Results show that the new system is a considerable improvement on previously available detection techniques.Keywords
This publication has 13 references indexed in Scilit:
- Nanodiffraction from platelet defects in diamondUltramicroscopy, 1984
- Analysis of photographic emulsions for electron microscopy of two-dimensional crystalline specimensUltramicroscopy, 1982
- Scanning transmission electron microscopy: microanalysis for the microelectronic ageJournal of Physics F: Metal Physics, 1981
- The U.T. Electronographic Camera: Present Status, Astronomical Performance and Future DevelopmentsPublished by Elsevier ,1980
- Electron MicrodiffractionPublished by Elsevier ,1978
- The Signal-to-Noise Ratio of Nuclear Track Emulsions Exposed to ElectronsThe Journal of Photographic Science, 1975
- Penetration and energy-loss theory of electrons in solid targetsJournal of Physics D: Applied Physics, 1972
- Mica windows for electronographic image tubesJournal of Physics E: Scientific Instruments, 1969
- Source–Detector Spectral Matching FactorsApplied Optics, 1968
- On Scanning Electron Diffraction†Journal of Electronics and Control, 1962