Reliability Studies of Planar Silicon Detectors
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 33 (1) , 272-278
- https://doi.org/10.1109/tns.1986.4337098
Abstract
For future large scale, long term applications of silicon particle detectors in high energy physics experiments, e.g. in proton or electron colliders, it is necessary to evaluate the reliability of such detectors. An automated measurement apparatus has been built, which is used to test planar silicon detectors for several days or weeks, both with and without irradiation. Defective detectors were studied with SEM and EBIC microscopy. Special test structures were designed to evaluate and possibly improve detector characteristics.Keywords
This publication has 9 references indexed in Scilit:
- Radiation damage in silicon strip detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1987
- The use of silicon photodiodes in a CsI(Tl) calorimeterNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1985
- Improvement of detector fabrication by the planar processNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1984
- Development of hardware around a silicon microstrip detector with 512 elementsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1984
- Radiation Damage: Experience with Silicon Detectors in High Energy Particle Beams at CERNPublished by Springer Nature ,1983
- Performance and Applications of Passivated Ion-Implanted Silicon DetectorsIEEE Transactions on Nuclear Science, 1982
- A silicon surface barrier microstrip detector designed for high energy physicsNuclear Instruments and Methods, 1980
- Electrical properties of electron-irradiated n-type siliconJournal of Applied Physics, 1976
- Correlation of Displacement Effects Produced by Electrons Protons and Neutrons in SiliconIEEE Transactions on Nuclear Science, 1975