Coaxial impact-collision ion scattering spectroscopy (CAICISS): A novel method for surface structure analysis
- 1 June 1988
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 33 (1-4) , 857-861
- https://doi.org/10.1016/0168-583x(88)90699-4
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Determination of the geometry of sulphur on nickel surfaces by low-energy ion scatteringSurface Science, 1986
- Impact-collision ion-scattering spectroscopy of Cu(110) and Cu(110)-(2×1)-O using 5-keVPhysical Review B, 1986
- Structure analysis of Ag overlayers on Si(111) by low-energy Li+ ion scatteringSurface Science, 1986
- Quantitative Surface Atomic Structure Analysis by Low-Energy Ion Scattering Spectroscopy (ISS)Japanese Journal of Applied Physics, 1985
- Real-Space Determination of Atomic Structure of the Si(111)--Au Surface by Low-Energy Alkali-Ion ScatteringPhysical Review Letters, 1985
- Direct Analysis of the Structure, Concentration, and Chemical Activity of Surface Atomic Vacancies by Specialized Low-Energy Ion-Scattering Spectroscopy: TiC(001)Physical Review Letters, 1983
- Interaction Potential between He+ and Ti in a keV Range as Revealed by a Specialized Technique in Ion Scattering SpectroscopyJapanese Journal of Applied Physics, 1982
- Low-Energy Ion Scattering from the Si(001) SurfacePhysical Review Letters, 1982
- Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion ScatteringJapanese Journal of Applied Physics, 1981
- Energy and mass spectra of neutral and charged particles scattered and desorbed from gold surfacesSurface Science, 1977