An Automated W-Band On-Wafer Noise Figure Measurement System
- 1 June 1993
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 23, 48-56
- https://doi.org/10.1109/arftg.1993.327019
Abstract
This paper presents an automated W-band on-wafer noise figure measurement system. This measurement system utilizes W-band on-wafer probes for MMIC testing. W-band testing procedures, which formerly required assembling transitions and MMIC chips in waveguide test fixtures, have been greatly simplified. Hundreds of W-band monolithic low noise amplifiers have been tested on this measurement system for both noise figure and associated gain. The results are consistent with the in-fixture test data. This is the first demonstration of on-wafer noise figure test of MMIC at W-band frequency.Keywords
This publication has 9 references indexed in Scilit:
- An ultra low noise W-band monolithic three-stage amplifier using 0.1- mu m pseudomorphic InGaAs/GaAs HEMT technologyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A W-band wafer probePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- MM-wave MIMIC receiver componentsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A W-band monolithic amplifierPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- 100 GHz high-gain InP MMIC cascode amplifierPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Monolithic GaAs W-band pseudomorphic MODFET amplifiersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- High-performance in W-band monolithic pseudomorphic InGaAs HEMT LNA's and design/analysis methodologyIEEE Transactions on Microwave Theory and Techniques, 1992
- A V-Band Wafer ProbePublished by Institute of Electrical and Electronics Engineers (IEEE) ,1990
- Theory of Noisy FourpolesProceedings of the IRE, 1956